29 August - Afternoon Session - Donatello Hall
  MS 82 X-ray Characterization of Nanostructures

Ugo Valbusa
Tilo Baumbach

C. Teichert
Quantitive Morphological Characterization of Nanostructure Arrays by Scanning Probe Microscopy
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J. Grenzer, U. Pietsch, S. Hazra, T. K. Chini, M. K. Sanyal
Ripple Structure of Ion Beam Induced Si Wafers
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H. Sawa, H. Sawa, Y. Murata, M. Murata, K. Komatsu
Direct Observation of a H2 Molecule Swallowed by Open-mouthed C60
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V. Holı, J. Stangl, G. Bauer, T. Schülli, T. H. Metzger
Anomalous X-ray Scattering Methods for Structure Investigations of Semiconductor Nanostructures
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G. Srajer, D. Haskel, J. C. Lang, C. K. Stevenson, Y. Choi, J. S. Jiang, S. D. Bader
Magnetic Imaging of Biquadratic Coupling in Ferromagnetic Bilayers
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