MS 60 Microstructural Properties from Powder Diffraction Data
Chairs: Davor Balzar Paolo Scardi
T. Ungar Subgrain Size-Distributions, Dislocation Structures, Stacking- and Twin Faults and Vacancy Concentrations in Crystalline Materials Determined by X-ray Line Profile Analysis Download Abstract M. Leoni Microstructural Studies of Nanocrystalline Materials using WPPM Download Abstract Download Presentation R. Kuzel Structural Studies of Nanocrystalline Metals Download Abstract N. Popa, D. Balzar Size Anisotropy and Lognormal Size Distribution in the Powder Diffraction whole Pattern Fitting Download Abstract N. Armstrong, J. P. Cline, J. Ritter, J. Bonevich Development of a NIST SRM 1979 Nano-Crystallite Size Standard for Broadening of X-Ray Line Profiles Download Abstract
This is an archive of the official website for the IUCrXX Congress at Florence in 2005. Some images and text may be missing and some links no longer work.
